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EFTA02444592
es using near-field contact-mode photolithography with an elastomeric phase mask", Rogers, J. A., Paul, K. E., Jackman, R. J. and Whitesides, G. M., J. ✓ac. Technol. B, 1998, 16, 59-68. 595. "Using Mixed Self-Assembled Monolayers Presenting RGD and (EG)3OH Groups To Characterize Long-Term Attachment
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