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EFTA02444592
ers of Alkylsiloxanes on Silicon: A Comparison of Results from Ellipsometry and Low-Angle X-Ray Reflectivity", Wasserman, S. R., Whitesides, G. M., Tidswell, I. M., Ocko, B. M., Pershan, P. S. and Axe, J. 0., J. Am. Chem. Soc., 1989, 111, 5852- 5861. 252. "Comparison of Self-Assembled Monolayers on Gold
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